DY294, the Digital Transistor DC Parameter Tester, is mainly used for testing the DC parameters of manifold semiconductors such as diode, transistor, controlled silicon and field effect transistor. It also can be used to test the withstand voltage of capacitor, protection voltage of varistor and isolation of electrical. Meanwhile it can test 78 and 79 series three-terminal voltage regulator.The tester has adopted the large scale integrated circuit for analogue/digital conversion. With high sensitivity and accuracy, it adopts liquid crystal display which can be read directly. With compact structure and convenient operation, it is portable and especially suitable for inspection and screening of devices and components in electronic factories as well as application of technicians engaged in electronic work, lab staff, maintainers and radio fans.

●Measuring forward voltage, reverse voltage, forward saturation voltage drop,amplification factor, reverse leakage current of various crystal diode, audion, silicon controlled rectifier(SCR), field effect transistor(FET).

●Measuring rated working voltage of chemical capacitor,terylene capacitor,Ta capacitor,Leaded multilayer ceramic capacitor,high voltage lacker.

●Measuring protection voltage of varistor.

●Measuring starting voltage of neon bulb, neon lamp.

●Measuring constant voltage value of 78,79 series three-pole circuit.

• Break Down Current V(BR):
• 1000V 0-1999V 1V breakdown current < 1mA
• 200V 0-199.9V 0.1V breakdown current < 1mA
• VCC(Set):
• 2A(Ic) 0-6.00V 0.01V Ic≈2000mA Ib≈200mA
• 800mA(Ic) 0-6.00V 0.01V Ic≈800mA Ib≈80mA
• 100mA(Ic) 0-6.00V 0.01V Ic≈100mA Ib≈1mA
• 10mA(Ic) 0-6.00V 0.01V Ic≈10mA Ib≈1mA
• hFE:
• 10mA(Ib) 0-199.9 0.1 Ib≈10mA
• 1mA(Ib) 0-1999 1 Ib≈1mA
• 1μA(Ib) 0-1999 1 Ib≈0.01mA
• Iceo:2000μA 0-1999μA 1μA Vce ≈ 27V
• 78,79 three-pole constant voltage value:78xx/79xx 0-24.0V 0.1V Ui ≈ 27V
• Dimension:150 x 100 x 70 mm
• Weight:1.2kgs